RESUMEN
Extended defects in wide-bandgap semiconductors have been widely investigated using techniques providing either spectroscopic or microscopic information. Nano-Fourier transform infrared spectroscopy (nano-FTIR) is a nondestructive characterization method combining FTIR with nanoscale spatial resolution (â¼20 nm) and topographic information. Here, we demonstrate the capability of nano-FTIR for the characterization of extended defects in semiconductors by investigating an in-grown stacking fault (IGSF) present in a 4H-SiC epitaxial layer. We observe a local spectral shift of the mid-infrared near-field response, consistent with the identification of the defect stacking order as 3C-SiC (cubic) from comparative simulations based on the finite dipole model (FDM). This 3C-SiC IGSF contrasts with the more typical 8H-SiC IGSFs reported previously and is exemplary in showing that nanoscale spectroscopy with nano-FTIR can provide new insights into the properties of extended defects, the understanding of which is crucial for mitigating deleterious effects of such defects in alternative semiconductor materials and devices.
RESUMEN
A method for gram-scale synthesis of graphitic carbon nitride quantum dots (g-C3N4QDs) was developed. The weight of the g-C3N4QDs was up to 1.32 g in each run with a yield of 66 wt%, and the purity was 99.96 wt%. The results showed that g-C3N4QDs exhibit a stable and strong ultraviolet photoluminescence at a wavelength of 365 nm. More interestingly, the g-C3N4QDs can be used as a high-efficiency, sensitive, and selective fluorescent probe to detect Fe3+ with a detection limit of 0.259 µM.
RESUMEN
Hexagonal boron nitride (h-BN) crystals grown under ultrahigh pressures and ultrahigh temperatures exhibit a high crystallinity and are used throughout the world as ideal substrates and insulating layers in van der Waals heterostructures. However, in their central region, these crystals have domains which contain a significant density of carbon impurities. In this study, we utilized cathodoluminescence and far-ultraviolet photoluminescence to reveal that the carbon (C)-rich domain can exist even after exfoliation. Then, we studied the carrier transport of graphene in h-BN/graphene/h-BN van der Waals heterostructures, precisely arranging the graphene to straddle the border of the C-rich domain in h-BN. We found that the carrier mobility of graphene on the C-rich h-BN domain was significantly suppressed. In addition, characteristic bending of the Landau fan diagram was observed on the electron-doped side. These results suggest that the C-rich domain in h-BN forms an impurity level and induces extrinsic carrier scattering into adjacent graphene.