RESUMEN
The development of high-power lasers requires optics with very low absorption to avoid detrimental thermal effects. In this work, we discuss our recent developments on the use of lock-in thermography to measure absorption. We apply this technique in a multipass configuration to increase the effective power on the tested samples. We present a system based on a kW-class ytterbium fiber laser operating at 1.07 µm wavelength, which enables exposing samples to 5 kW effective power and measuring absorption in the ppm range. The implementation, calibration procedure, and obtained performance are discussed with some applications to single-layer coatings of HfO2,Ta2O5,TiO2,Nb2O5, and SiO2 deposited by plasma-assisted electron beam deposition.
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We present a new method for the in situ measurement of the amplitude and phase of the reflection coefficient of a plane substrate installed in a mechanical holder rotating at high speed (120 turns per minute) during the deposition of optical thin films. Our method is based on digital holography and uses a self-referenced scheme to cancel the effects of the severe constraints generated by the vibrational and thermal environment of the deposition machine.
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An alternative new technique for the determination of efficient optical monitoring strategies of optical interference filters is presented. This technique relies on the analysis of optical monitoring signals for different optical monitoring wavelengths and the comparison of these signals with some pre-defined criteria in order to generate potential spectral paths compatible with a dedicated trigger point monitoring technique. Trinary mappings are then generated in order to determine possible optical monitoring strategies. This technique is finally implemented on various filter designs and experimentally validated.
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This paper extends a method previously applied to the determination of the optical constants of a high-index thin film to a dielectric bilayer. This method is based on the time recording of the spectral transmittance of the stack during its deposition with the help of an in situ broadband monitoring system.
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In this work, we addressed the local degradation mechanisms limiting the prelaunch environmental durability of thin-layered silver stacks for demanding space mirror applications. Local initiation and propagation of tarnishing were studied by combined surface and interface analysis on model stack samples consisting of thin silver layers supported on lightweight SiC substrates and protected by thin SiO2 overcoats, deposited by cathodic magnetron sputtering and submitted to accelerated aging in gaseous H2S. The results show that tarnishing is locally initiated by the formation of Ag2S columns erupting above the stack surface. Ag2S growth is promoted at high aspect ratio defects (surface pores) of the SiC substrate as a result of an imperfect protection by the SiO2 overcoat. Channels most likely connect the silver layer to its environment through the protection layer, which enables local H2S entry and Ag2S growth. The silver sulfide columns grow in number and size eventually leading to coalescence with increasing H2S exposure. In more advanced stages, tarnishing slows down owing to saturation of all pre-existing imperfectly protected sites of preferential sulfidation. However, it progresses radially at the basis of the Ag2S columns underneath the protection layer, consuming the metallic silver layer and deteriorating the protecting overcoat.
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This paper describes a new method based on the use of a broadband monitoring system to determine the spectral dependence of the optical constants of a layer without using a dispersion model.
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The possibility of enhanced mirrors for laser megajoule reflectors has been studied, and preliminary samples have been realized with magnetron sputtering technology. Spectral measurements of improved reflectivity and cosmetics analysis are presented.
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Numerical calculation is performed to validate the principles of a single optical technique devoted to real time probing or imaging of submultilayers within interferential coatings.