Use of a broadband monitoring system for the determination of the optical constants of a dielectric bilayer.
Appl Opt
; 57(4): 877-883, 2018 Feb 01.
Article
en En
| MEDLINE
| ID: mdl-29400759
This paper extends a method previously applied to the determination of the optical constants of a high-index thin film to a dielectric bilayer. This method is based on the time recording of the spectral transmittance of the stack during its deposition with the help of an in situ broadband monitoring system.
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01-internacional
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MEDLINE
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En
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Appl Opt
Año:
2018
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Article
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Estados Unidos