Chemical Characterization for III-V Semiconductor Heterostructures Investigated by Aberration-Corrected STEM.

Peña, Roy D; Diaz, Rosa E; Liang, Shuang; Manfra, Michael J

Peña, Roy D; Diaz, Rosa E; Liang, Shuang; Manfra, Michael J.

Afiliação

Peña RD; Department of Electrical, Electronics, Informatic, and Mechanical Engineering, Universidad Nacional de San Antonio Abad del Cusco, Cusco, Peru.
Diaz RE; Birck Nanotechnology Center, Purdue University, West Lafayette, IN, United States.
Liang S; Birck Nanotechnology Center, Purdue University, West Lafayette, IN, United States.
Manfra MJ; Birck Nanotechnology Center, Purdue University, West Lafayette, IN, United States.

Microsc Microanal ; 29(Supplement_1): 1663-1664, 2023 Jul 22.

Article em En | MEDLINE | ID: mdl-37613956

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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Microsc Microanal Ano de publicação: 2023 Tipo de documento: Article País de afiliação: Peru País de publicação: Reino Unido

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