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Melamine Faced Panels Defect Classification beyond the Visible Spectrum.
Aguilera, Cristhian A; Aguilera, Cristhian; Sappa, Angel D.
Afiliação
  • Aguilera CA; Universidad Tecnológica de Chile INACAP, Av. Vitacura 10.151, Vitacura 7650033, Santiago, Chile. c_aguilerac@inacap.cl.
  • Aguilera C; University of Bío-Bío, DIEE, Concepción 4051381, Concepción, Chile. cristhia@ubiobio.cl.
  • Sappa AD; Computer Vision Center, Edifici O, Campus UAB, Bellaterra, 08193 Barcelona, Spain. asappa@cvc.uab.es.
Sensors (Basel) ; 18(11)2018 Oct 27.
Article em En | MEDLINE | ID: mdl-30373245
In this work, we explore the use of images from different spectral bands to classify defects in melamine faced panels, which could appear through the production process. Through experimental evaluation, we evaluate the use of images from the visible (VS), near-infrared (NIR), and long wavelength infrared (LWIR), to classify the defects using a feature descriptor learning approach together with a support vector machine classifier. Two descriptors were evaluated, Extended Local Binary Patterns (E-LBP) and SURF using a Bag of Words (BoW) representation. The evaluation was carried on with an image set obtained during this work, which contained five different defect categories that currently occurs in the industry. Results show that using images from beyond the visual spectrum helps to improve classification performance in contrast with a single visible spectrum solution.
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Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sensors (Basel) Ano de publicação: 2018 Tipo de documento: Article País de afiliação: Chile País de publicação: Suíça

Texto completo: 1 Coleções: 01-internacional Base de dados: MEDLINE Idioma: En Revista: Sensors (Basel) Ano de publicação: 2018 Tipo de documento: Article País de afiliação: Chile País de publicação: Suíça