High-quality quartz single crystals for high-energy-resolution inelastic X-ray scattering analyzers.
J Appl Crystallogr
; 46(Pt 4): 939-944, 2013 Aug 01.
Article
em En
| MEDLINE
| ID: mdl-24046502
Spherical analyzers are well known instruments for inelastic X-ray scattering (IXS) experiments. High-resolution IXS experiments almost always use Si single crystals as monochromators and spherical analyzers. At higher energies (>20â
keV) Si shows a high energy resolution (<10â
meV), at an exact symmetric back-diffraction condition, since the energy resolution is given by the real part of the susceptibility or polarizability. However, at low energies (<10â
keV), high energy resolution is difficult to achieve with Si. α-SiO2 (quartz) can be an option, since it offers high energy resolution at low energies. In this work, the characterization of high-quality α-SiO2 is presented. Such characterization is made by high-resolution rocking curve, topography and lattice parameter mapping in different samples from a single block. X-ray optics with α-SiO2 for IXS at lower energies (from 2.5 to 12.6 keV) with medium to high energy resolution (from 90 to 11 meV) are proposed and theoretically exploited.
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Coleções:
01-internacional
Base de dados:
MEDLINE
Idioma:
En
Revista:
J Appl Crystallogr
Ano de publicação:
2013
Tipo de documento:
Article
País de afiliação:
Brasil
País de publicação:
Estados Unidos