Rubidium and Cesium Ion-Induced Electron and Ion Signals for Scanning Ion Microscopy Applications.
Microsc Microanal
; 30(5): 817-824, 2024 Nov 04.
Article
en En
| MEDLINE
| ID: mdl-39255067
ABSTRACT
Scanning ion microscopy applications of novel focused ion beam (FIB) systems based on ultracold rubidium (Rb) and cesium (Cs) atoms were investigated via ion-induced electron and ion yields. Results measured on the Rb+ and Cs+ FIB systems were compared with results from commercially available gallium (Ga+) FIB systems to verify the merits of applying Rb+ and Cs+ for imaging. The comparison shows that Rb+ and Cs+ have higher secondary electron (SE) yields on a variety of pure element targets than Ga+, which implies a higher signal-to-noise ratio can be achieved for the same dose in SE imaging using Rb+/Cs+ than Ga+. In addition, analysis of the ion-induced ion signals reveals that secondary ions dominate Cs+ induced ion signals while the Rb+/Ga+ induced signals contain more backscattered ions.
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1
Colección:
01-internacional
Base de datos:
MEDLINE
Idioma:
En
Revista:
Microsc Microanal
Año:
2024
Tipo del documento:
Article
País de afiliación:
Países Bajos
Pais de publicación:
Reino Unido