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Polarized Raman mapping and phase-transition by CW excitation for fast purely optical characterization of VO2 thin films.
Mussi, V; Bovino, F A; Falsini, R; Daloiso, D; Lupo, F V; Kunjumon, R; Voti, R Li; Cesca, T; Macaluso, R; Sibilia, C; Mattei, G.
Afiliación
  • Mussi V; Institute for Microelectronics and Microsystems (IMM), Consiglio Nazionale Delle Ricerche (CNR), Via del Fosso del Cavaliere 100, 00133, Rome, Italy. valentina.mussi@cnr.it.
  • Bovino FA; Department of Basic and Applied Sciences for Engineering (SBAI), Sapienza University, Via A. Scarpa 16, 00161, Rome, Italy.
  • Falsini R; Department of Basic and Applied Sciences for Engineering (SBAI), Sapienza University, Via A. Scarpa 16, 00161, Rome, Italy.
  • Daloiso D; Department of Basic and Applied Sciences for Engineering (SBAI), Sapienza University, Via A. Scarpa 16, 00161, Rome, Italy.
  • Lupo FV; Thin Films Laboratory (TFL), Department of Engineering, University of Palermo, Viale Delle Scienze (Ed. 9), 90128, Palermo, Italy.
  • Kunjumon R; Department of Basic and Applied Sciences for Engineering (SBAI), Sapienza University, Via A. Scarpa 16, 00161, Rome, Italy.
  • Voti RL; Department of Basic and Applied Sciences for Engineering (SBAI), Sapienza University, Via A. Scarpa 16, 00161, Rome, Italy.
  • Cesca T; Department of Physics and Astronomy, University of Padova, Via F. Marzolo 8, 35131, Padova, Italy.
  • Macaluso R; Thin Films Laboratory (TFL), Department of Engineering, University of Palermo, Viale Delle Scienze (Ed. 9), 90128, Palermo, Italy.
  • Sibilia C; Department of Basic and Applied Sciences for Engineering (SBAI), Sapienza University, Via A. Scarpa 16, 00161, Rome, Italy.
  • Mattei G; Department of Physics and Astronomy, University of Padova, Via F. Marzolo 8, 35131, Padova, Italy.
Sci Rep ; 14(1): 19338, 2024 Aug 20.
Article en En | MEDLINE | ID: mdl-39164376
ABSTRACT
Vanadium dioxide has attracted much interest due to the drastic change of the electrical and optical properties it exhibits during the transition from the semiconductor state to the metallic state, which takes place at a critical temperature of about 68 °C. Much study has been especially devoted to developing advanced fabrication methodologies to improve the performance of VO2 thin films for phase-change applications in optical devices. Films structural and morphological characterisation is normally performed with expensive and time consuming equipment, as x-ray diffractometers, electron microscopes and atomic force microscopes. Here we propose a purely optical approach which combines Polarized Raman Mapping and Phase-Transition by Continuous Wave Optical Excitation (PTCWE) to acquire through two simple measurements structural, morphological and thermal behaviour information on polycrystalline VO2 thin films. The combination of the two techniques allows to reconstruct a complete picture of the properties of the films in a fast and effective manner, and also to unveil an interesting stepped appearance of the hysteresis cycles probably induced by the progressive stabilization of rutile metallic domains embedded in the semiconducting monoclinic matrix.
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Sci Rep Año: 2024 Tipo del documento: Article País de afiliación: Italia Pais de publicación: Reino Unido
Texto completo
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Sci Rep Año: 2024 Tipo del documento: Article País de afiliación: Italia Pais de publicación: Reino Unido