Semi-supervised skin cancer diagnosis based on self-feedback threshold focal learning.
Discov Oncol
; 15(1): 180, 2024 May 22.
Article
en En
| MEDLINE
| ID: mdl-38776027
ABSTRACT
Worldwide, skin cancer prevalence necessitates accurate diagnosis to alleviate public health burdens. Although the application of artificial intelligence in image analysis and pattern recognition has improved the accuracy and efficiency of early skin cancer diagnosis, existing supervised learning methods are limited due to their reliance on a large amount of labeled data. To overcome the limitations of data labeling and enhance the performance of diagnostic models, this study proposes a semi-supervised skin cancer diagnostic model based on Self-feedback Threshold Focal Learning (STFL), capable of utilizing partial labeled and a large scale of unlabeled medical images for training models in unseen scenarios. The proposed model dynamically adjusts the selection threshold of unlabeled samples during training, effectively filtering reliable unlabeled samples and using focal learning to mitigate the impact of class imbalance in further training. The study is experimentally validated on the HAM10000 dataset, which includes images of various types of skin lesions, with experiments conducted across different scales of labeled samples. With just 500 annotated samples, the model demonstrates robust performance (0.77 accuracy, 0.6408 Kappa, 0.77 recall, 0.7426 precision, and 0.7462 F1-score), showcasing its efficiency with limited labeled data. Further, comprehensive testing validates the semi-supervised model's significant advancements in diagnostic accuracy and efficiency, underscoring the value of integrating unlabeled data. This model offers a new perspective on medical image processing and contributes robust scientific support for the early diagnosis and treatment of skin cancer.
Texto completo:
1
Colección:
01-internacional
Base de datos:
MEDLINE
Idioma:
En
Revista:
Discov Oncol
Año:
2024
Tipo del documento:
Article
País de afiliación:
China
Pais de publicación:
Estados Unidos