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Understanding the Electron Beam Resilience of Two-Dimensional Conjugated Metal-Organic Frameworks.
Mücke, David; Cooley, Isabel; Liang, Baokun; Wang, Zhiyong; Park, SangWook; Dong, Renhao; Feng, Xinliang; Qi, Haoyuan; Besley, Elena; Kaiser, Ute.
Afiliación
  • Mücke D; Central Facility for Materials Science Electron Microscopy, Universität Ulm, 89081 Ulm, Germany.
  • Cooley I; School of Chemistry, University of Nottingham, University Park, Nottingham NG7 2RD, United Kingdom.
  • Liang B; Central Facility for Materials Science Electron Microscopy, Universität Ulm, 89081 Ulm, Germany.
  • Wang Z; Max Planck Institute of Microstructure Physics, 06120 Halle (Saale), Germany.
  • Park S; Faculty of Chemistry and Food Chemistry & Center for Advancing Electronics Dresden, Technische Universität Dresden, 01062 Dresden, Germany.
  • Dong R; Faculty of Chemistry and Food Chemistry & Center for Advancing Electronics Dresden, Technische Universität Dresden, 01062 Dresden, Germany.
  • Feng X; Faculty of Chemistry and Food Chemistry & Center for Advancing Electronics Dresden, Technische Universität Dresden, 01062 Dresden, Germany.
  • Qi H; Key Laboratory of Colloid and Interface Chemistry of the Ministry of Education, School of Chemistry and Chemical Engineering, Shandong University, 250100 Jinan, China.
  • Besley E; Max Planck Institute of Microstructure Physics, 06120 Halle (Saale), Germany.
  • Kaiser U; Faculty of Chemistry and Food Chemistry & Center for Advancing Electronics Dresden, Technische Universität Dresden, 01062 Dresden, Germany.
Nano Lett ; 24(10): 3014-3020, 2024 Mar 13.
Article en En | MEDLINE | ID: mdl-38427697
ABSTRACT
Knowledge of the atomic structure of layer-stacked two-dimensional conjugated metal-organic frameworks (2D c-MOFs) is an essential prerequisite for establishing their structure-property correlation. For this, atomic resolution imaging is often the method of choice. In this paper, we gain a better understanding of the main properties contributing to the electron beam resilience and the achievable resolution in the high-resolution TEM images of 2D c-MOFs, which include chemical composition, density, and conductivity of the c-MOF structures. As a result, sub-angstrom resolution of 0.95 Å has been achieved for the most stable 2D c-MOF of the considered structures, Cu3(BHT) (BHT = benzenehexathiol), at an accelerating voltage of 80 kV in a spherical and chromatic aberration-corrected TEM. Complex damage mechanisms induced in Cu3(BHT) by the elastic interactions with the e-beam have been explained using detailed ab initio molecular dynamics calculations. Experimental and calculated knock-on damage thresholds are in good agreement.
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Nano Lett Año: 2024 Tipo del documento: Article País de afiliación: Alemania Pais de publicación: Estados Unidos
Texto completo
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Nano Lett Año: 2024 Tipo del documento: Article País de afiliación: Alemania Pais de publicación: Estados Unidos