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The Potential of Subsampling and Inpainting for Fast Low-Dose Cryo FIB-SEM Imaging.
Nicholls, Daniel; Kobylynska, Maryna; Broad, Zoë; Wells, Jack; Robinson, Alex; McGrouther, Damien; Moshtaghpour, Amirafshar; Kirkland, Angus I; Fleck, Roland A; Browning, Nigel D.
Afiliación
  • Nicholls D; Department of Mechanical, Materials and Aerospace Engineering, University of Liverpool, Liverpool, L69 3BX, UK.
  • Kobylynska M; SenseAI Innovations Ltd., Liverpool, L69 3BX, UK.
  • Broad Z; Centre for Ultrastructural Imaging, King's College London, London, WC2R 2LS, UK.
  • Wells J; Randall Centre for Cell and Molecular Biophysics, King's College London, London, WC2R 2LS, UK.
  • Robinson A; Department of Mechanical, Materials and Aerospace Engineering, University of Liverpool, Liverpool, L69 3BX, UK.
  • McGrouther D; Distributed Algorithms Centre for Doctoral Training, University of Liverpool, Liverpool, L69 3BX, UK.
  • Moshtaghpour A; Department of Mechanical, Materials and Aerospace Engineering, University of Liverpool, Liverpool, L69 3BX, UK.
  • Kirkland AI; SenseAI Innovations Ltd., Liverpool, L69 3BX, UK.
  • Fleck RA; JEOL (UK) Ltd., Welwyn Garden City, AL7 1LT, UK.
  • Browning ND; Department of Mechanical, Materials and Aerospace Engineering, University of Liverpool, Liverpool, L69 3BX, UK.
Microsc Microanal ; 30(1): 96-102, 2024 Mar 07.
Article en En | MEDLINE | ID: mdl-38321738
ABSTRACT
Traditional image acquisition for cryo focused ion-beam scanning electron microscopy (FIB-SEM) tomography often sees thousands of images being captured over a period of many hours, with immense data sets being produced. When imaging beam sensitive materials, these images are often compromised by additional constraints related to beam damage and the devitrification of the material during imaging, which renders data acquisition both costly and unreliable. Subsampling and inpainting are proposed as solutions for both of these aspects, allowing fast and low-dose imaging to take place in the Focused ion-beam scanning electron microscopy FIB-SEM without an appreciable loss in image quality. In this work, experimental data are presented which validate subsampling and inpainting as a useful tool for convenient and reliable data acquisition in a FIB-SEM, with new methods of handling three-dimensional data being employed in the context of dictionary learning and inpainting algorithms using a newly developed microscope control software and data recovery algorithm.
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Microsc Microanal Año: 2024 Tipo del documento: Article País de afiliación: Reino Unido Pais de publicación: Reino Unido
Texto completo
Añadir a Mi BVS
Imprimir
XML
PubMed Links
Buscar en Google

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Microsc Microanal Año: 2024 Tipo del documento: Article País de afiliación: Reino Unido Pais de publicación: Reino Unido