Highly flexible anisotropic magnetoresistance sensor for wearable electronics.

Chen, Yanning; Zhao, Dongyan; Shao, Jin; Fu, Zhen; Wang, Chenying; Wang, Shuaipeng; Du, Jian; Zhong, Mingchen; Duan, Junbao; Li, Yang; Hu, Zhongqiang

Chen, Yanning; Zhao, Dongyan; Shao, Jin; Fu, Zhen; Wang, Chenying; Wang, Shuaipeng; Du, Jian; Zhong, Mingchen; Duan, Junbao; Li, Yang; Hu, Zhongqiang.

Afiliación

Chen Y; National and Local Joint Engineering Research Center for Reliability Technology of Energy Internet Intelligent Terminal Core Chip, Beijing Smart-Chip Microelectronics Technology Co., Ltd., Beijing 100192, China.
Zhao D; Beijing Chip Identification Technology Co., Ltd., Beijing 102200, China.
Shao J; National and Local Joint Engineering Research Center for Reliability Technology of Energy Internet Intelligent Terminal Core Chip, Beijing Smart-Chip Microelectronics Technology Co., Ltd., Beijing 100192, China.
Fu Z; National and Local Joint Engineering Research Center for Reliability Technology of Energy Internet Intelligent Terminal Core Chip, Beijing Smart-Chip Microelectronics Technology Co., Ltd., Beijing 100192, China.
Wang C; Beijing Chip Identification Technology Co., Ltd., Beijing 102200, China.
Wang S; International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technology, Xi'an Jiaotong University, Xi'an 710049, China.
Du J; Beijing Chip Identification Technology Co., Ltd., Beijing 102200, China.
Zhong M; National and Local Joint Engineering Research Center for Reliability Technology of Energy Internet Intelligent Terminal Core Chip, Beijing Smart-Chip Microelectronics Technology Co., Ltd., Beijing 100192, China.
Duan J; Beijing Chip Identification Technology Co., Ltd., Beijing 102200, China.
Li Y; Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education and International Center for Dielectric Research, School of Electronic Science and Engineering, Xi'an Jiaotong University, Xi'an 710049, China.
Hu Z; Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education and International Center for Dielectric Research, School of Electronic Science and Engineering, Xi'an Jiaotong University, Xi'an 710049, China.

Rev Sci Instrum ; 94(4)2023 Apr 01.

Article en En | MEDLINE | ID: mdl-38081229

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Rev Sci Instrum Año: 2023 Tipo del documento: Article País de afiliación: China Pais de publicación: Estados Unidos

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