Sample thickness affects contrast and measured shape in TEM images and in electron tomograms.

Hayashida, Misa; Yamasaki, Jun; Malac, Marek

Hayashida, Misa; Yamasaki, Jun; Malac, Marek.

Afiliación

Hayashida M; NRC-NANO, National Research Council, Edmonton, Alberta T6G 2M9, Canada. Electronic address: misa.hayashida@nrc-cnrc.gc.ca.
Yamasaki J; Research Center for Ultra-High Voltage Electron Microscopy, Osaka University, Ibaraki 567-0047, Japan; Institute of Materials and Systems for Sustainability, Nagoya University, Nagoya 464-8601, Japan.
Malac M; NRC-NANO, National Research Council, Edmonton, Alberta T6G 2M9, Canada; Department of Physics, University of Alberta, Edmonton, Alberta T6G 2E1, Canada.

Micron ; 177: 103562, 2024 Feb.

Article en En | MEDLINE | ID: mdl-37992499

RESUMEN

We investigated the effect of nanoparticle (NP) image broadening and its contrast change dependence on a support matrix thickness in a transmission electron microscope (TEM). We measured the effect of NP size and atomic number on its image broadening. Based on the experimental TEM images we generated tomograms of NPs on four types of support matrix. The measured shape aspect ratio of the NPs in such tomograms depends on the geometry of the support matrix. For example, the aspect ratio of 6 nm NP placed on a thin film with window-frame support is 1.14, while the aspect ratio of 6 nm NP on a rod-shaped support with 910 nm diameter is 1.67 in a tomogram.

Palabras clave

Electron tomography; Image quality; Multiple scattering; Nanoparticle shape; Thick sample; Top-bottom effect; Transmission electron microscopy (TEM)

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Micron Asunto de la revista: DIAGNOSTICO POR IMAGEM Año: 2024 Tipo del documento: Article Pais de publicación: Reino Unido

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