Domain-dependent strain and stacking in two-dimensional van der Waals ferroelectrics.

Shi, Chuqiao; Mao, Nannan; Zhang, Kena; Zhang, Tianyi; Chiu, Ming-Hui; Ashen, Kenna; Wang, Bo; Tang, Xiuyu; Guo, Galio; Lei, Shiming; Chen, Longqing; Cao, Ye; Qian, Xiaofeng; Kong, Jing; Han, Yimo

Shi, Chuqiao; Mao, Nannan; Zhang, Kena; Zhang, Tianyi; Chiu, Ming-Hui; Ashen, Kenna; Wang, Bo; Tang, Xiuyu; Guo, Galio; Lei, Shiming; Chen, Longqing; Cao, Ye; Qian, Xiaofeng; Kong, Jing; Han, Yimo.

Afiliación

Shi C; Department of Materials Science and NanoEngineering, Rice University, Houston, TX, 77005, USA.
Mao N; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA.
Zhang K; Department of Chemical Engineering, Massachusetts Institute of Technology, Cambridge, MA, USA.
Zhang T; Departments of Materials Science and Engineering, University of Texas at Arlington, Arlington, TX, USA.
Chiu MH; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA.
Ashen K; Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, Cambridge, MA, USA.
Wang B; Departments of Materials Science and Engineering, Texas A&M University, College Station, TX, USA.
Tang X; Materials Research Institute and Department of Materials Science and Engineering, The Pennsylvania State University, University Park, PA, USA.
Guo G; Departments of Materials Science and Engineering, Texas A&M University, College Station, TX, USA.
Lei S; Department of Materials Science and NanoEngineering, Rice University, Houston, TX, 77005, USA.
Chen L; Department of Physics, Rice University, Houston, TX, 77005, USA.
Cao Y; Materials Research Institute and Department of Materials Science and Engineering, The Pennsylvania State University, University Park, PA, USA.
Qian X; Departments of Materials Science and Engineering, University of Texas at Arlington, Arlington, TX, USA.
Kong J; Departments of Materials Science and Engineering, Texas A&M University, College Station, TX, USA.
Han Y; Department of Electrical and Computer Engineering, Texas A&M University, College Station, TX, USA.

Nat Commun ; 14(1): 7168, 2023 Nov 07.

Article en En | MEDLINE | ID: mdl-37935672

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Nat Commun Asunto de la revista: BIOLOGIA / CIENCIA Año: 2023 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Reino Unido

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