Security-Reliability Analysis of AF Full-Duplex Relay Networks Using Self-Energy Recycling and Deep Neural Networks.

Nguyen, Tan N; Minh, Bui Vu; Tran, Dinh-Hieu; Le, Thanh-Lanh; Le, Anh-Tu; Nguyen, Quang-Sang; Lee, Byung Moo

Nguyen, Tan N; Minh, Bui Vu; Tran, Dinh-Hieu; Le, Thanh-Lanh; Le, Anh-Tu; Nguyen, Quang-Sang; Lee, Byung Moo.

Afiliación

Nguyen TN; Communication and Signal Processing Research Group, Faculty of Electrical and Electronics Engineering, Ton Duc Thang University, Ho Chi Minh City 70000, Vietnam.
Minh BV; Faculty of Engineering and Technology, Nguyen Tat Thanh University, 300A-Nguyen Tat Thanh, Ward 13, District 4, Ho Chi Minh City 754000, Vietnam.
Tran DH; Department of Technology, Dong Nai Technology University, Bien Hoa 76000, Vietnam.
Le TL; Department of Technology, Dong Nai Technology University, Bien Hoa 76000, Vietnam.
Le AT; Faculty of Electrical Engineering and Computer Science, VSB-Technical University of Ostrava, 17. Listopadu 2172/15, 70800 Ostrava, Czech Republic.
Nguyen QS; Science and Technology Application for Sustainable Development Research Group, Ho Chi Minh City University of Transport, Ho Chi Minh City 70000, Vietnam.
Lee BM; Department of Intelligent Mechatronics Engineering, and Convergence Engineering for Intelligent Drone, Sejong University, Seoul 05006, Republic of Korea.

Sensors (Basel) ; 23(17)2023 Sep 02.

Article en En | MEDLINE | ID: mdl-37688073

Palabras clave

deep learning network (DNN); full duplex (FD); intercept probability (IP); outage probability (OP); physical layer security (PLS); self-energy recycling

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Guideline Idioma: En Revista: Sensors (Basel) Año: 2023 Tipo del documento: Article País de afiliación: Vietnam Pais de publicación: Suiza

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