Thickness-Dependent Layer Stacking Disorder in Low and High Temperature Phase of MoTe2 via STEM Imaging.

Bhatt, Lopa; Hart, James L; Bianco, Elisabeth; Cha, Judy; Kourkoutis, Lena F

Bhatt, Lopa; Hart, James L; Bianco, Elisabeth; Cha, Judy; Kourkoutis, Lena F.

Afiliación

Bhatt L; School of Applied and Engineering Physics, Cornell University, Ithaca, NY, United States.
Hart JL; Department of Materials Science and Engineering, Cornell University, Ithaca, NY, United States.
Bianco E; Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY, United States.
Cha J; Department of Materials Science and Engineering, Cornell University, Ithaca, NY, United States.
Kourkoutis LF; School of Applied and Engineering Physics, Cornell University, Ithaca, NY, United States.

Microsc Microanal ; 29(Supplement_1): 1735-1736, 2023 Jul 22.

Article en En | MEDLINE | ID: mdl-37613765

Texto completo

Añadir a Mi BVS

Imprimir

XML

PubMed Links

Buscar en Google

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Microsc Microanal Año: 2023 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Reino Unido

Texto completo

Añadir a Mi BVS

Imprimir

XML

PubMed Links

Buscar en Google