Deformation Defects Characterization in Short-range Ordered CrCoNi using Fast Electron Detectors and 4D-STEM.

Yin, Kaijun; Hsiao, Haw-Wen; Feng, Rui; Liaw, Peter K; Zuo, Jian-Min

Yin, Kaijun; Hsiao, Haw-Wen; Feng, Rui; Liaw, Peter K; Zuo, Jian-Min.

Afiliación

Yin K; Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois, United States of America.
Hsiao HW; Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois, United States of America.
Feng R; Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois, United States of America.
Liaw PK; Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois, United States of America.
Zuo JM; Neutron Scattering Division, Oak Ridge National Laboratory, Oak Ridge, TN, United States.

Microsc Microanal ; 29(Supplement_1): 251-253, 2023 Jul 22.

Article en En | MEDLINE | ID: mdl-37613546

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Microsc Microanal Año: 2023 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Reino Unido

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