Installation of New Systems for High-Energy Electron Energy-loss Spectrometry in an Aberration-Corrected Scanning Transmission Electron Microscope.

Watanabe, Masashi; Guzzinati, Giulio; Kükelhan, Pirmin; Gerheim, Volker; Linck, Martin; Müller, Heiko; Haider, Max; Hoffman, Thomas F; Isabell, Thomas; Shimura, Naoki; Sawada, Hidetaka

Watanabe, Masashi; Guzzinati, Giulio; Kükelhan, Pirmin; Gerheim, Volker; Linck, Martin; Müller, Heiko; Haider, Max; Hoffman, Thomas F; Isabell, Thomas; Shimura, Naoki; Sawada, Hidetaka.

Afiliación

Watanabe M; Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA, United States.
Guzzinati G; CEOS GmbH, Heidelberg, Germany.
Kükelhan P; CEOS GmbH, Heidelberg, Germany.
Gerheim V; CEOS GmbH, Heidelberg, Germany.
Linck M; CEOS GmbH, Heidelberg, Germany.
Müller H; CEOS GmbH, Heidelberg, Germany.
Haider M; CEOS GmbH, Heidelberg, Germany.
Hoffman TF; JEOL USA, Peabody, MA, United States.
Isabell T; JEOL USA, Peabody, MA, United States.
Shimura N; JEOL USA, Peabody, MA, United States.
Sawada H; JEOL USA, Peabody, MA, United States.

Microsc Microanal ; 29(Supplement_1): 416-417, 2023 Jul 22.

Article en En | MEDLINE | ID: mdl-37613132

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Microsc Microanal Año: 2023 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Reino Unido

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