Subsampling Methods for Fast Electron Backscattered Diffraction Analysis for SEM.

Broad, Zoë; Nicholls, Daniel; Wells, Jack; Moshtaghpour, Amirafshar; Robinson, Alex W; Masters, Robert; Hughes, Louise; Browning, Nigel D

Broad, Zoë; Nicholls, Daniel; Wells, Jack; Moshtaghpour, Amirafshar; Robinson, Alex W; Masters, Robert; Hughes, Louise; Browning, Nigel D.

Afiliación

Broad Z; Department of Mechanical, Materials and Aerospace Engineering, University of Liverpool, UK.
Nicholls D; Department of Mechanical, Materials and Aerospace Engineering, University of Liverpool, UK.
Wells J; Distributed Algorithms Centre for Doctoral Training, University of Liverpool, Liverpool, UK.
Moshtaghpour A; Department of Mechanical, Materials and Aerospace Engineering, University of Liverpool, UK.
Robinson AW; Correlated Imaging Group, Rosalind Franklin Institute, Harwell Science and Innovation Campus, Didcot, UK.
Masters R; Department of Mechanical, Materials and Aerospace Engineering, University of Liverpool, UK.
Hughes L; Oxford Instruments Nanoanalysis, High Wycombe, UK.
Browning ND; Oxford Instruments Nanoanalysis, High Wycombe, UK.

Microsc Microanal ; 29(Supplement_1): 467-469, 2023 Jul 22.

Article en En | MEDLINE | ID: mdl-37613063

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Microsc Microanal Año: 2023 Tipo del documento: Article País de afiliación: Reino Unido Pais de publicación: Reino Unido

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