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Extended Sentinel Monitoring of Helicoverpa zea Resistance to Cry and Vip3Aa Toxins in Bt Sweet Corn: Assessing Changes in Phenotypic and Allele Frequencies of Resistance.
Dively, Galen P; Kuhar, Tom P; Taylor, Sally V; Doughty, Helene; Holmstrom, Kristian; Gilrein, Daniel O; Nault, Brian A; Ingerson-Mahar, Joseph; Huseth, Anders; Reisig, Dominic; Fleischer, Shelby; Owens, David; Tilmon, Kelley; Reay-Jones, Francis; Porter, Pat; Smith, Jocelyn; Saguez, Julien; Wells, Jason; Congdon, Caitlin; Byker, Holly; Jensen, Bryan; DiFonzo, Chris; Hutchison, William D; Burkness, Eric; Wright, Robert; Crossley, Michael; Darby, Heather; Bilbo, Tom; Seiter, Nicholas; Krupke, Christian; Abel, Craig; Coates, Brad S; McManus, Bradley; Fuller, Billy; Bradshaw, Jeffrey; Peterson, Julie A; Buntin, David; Paula-Moraes, Silvana; Kesheimer, Katelyn; Crow, Whitney; Gore, Jeffrey; Huang, Fangneng; Ludwick, Dalton C; Raudenbush, Amy; Jimenez, Sebastian; Carrière, Yves; Elkner, Timothy; Hamby, Kelly.
Afiliación
  • Dively GP; Department of Entomology, University of Maryland, College Park, MD 20742, USA.
  • Kuhar TP; Department of Entomology, Virginia Tech, Blacksburg, VA 24060, USA.
  • Taylor SV; Department of Entomology, Virginia Tech, Suffolk, VA 23434, USA.
  • Doughty H; Virginia Tech ESAREC/Entomology, Painter, VA 23420, USA.
  • Holmstrom K; Pest Management Office, Rutgers University, New Brunswick, NJ 08901, USA.
  • Gilrein DO; LIHREC, Cornell University, Riverhead, NY 11901, USA.
  • Nault BA; Department of Entomology, Cornell AgriTech, Geneva, NY 14456, USA.
  • Ingerson-Mahar J; Rutgers Agricultural Research and Extension Center, Rutgers University, Bridgeton, NJ 08302, USA.
  • Huseth A; Department of Entomology and Plant Pathology, NC State University, Raleigh, NC 27601, USA.
  • Reisig D; Department of Entomology and Plant Pathology, NC State University, Plymouth, NC 27962, USA.
  • Fleischer S; Department of Entomology, Penn State University, University Park, PA 16802, USA.
  • Owens D; Cooperative Extension, Carvel REC, University of Delaware, Georgetown, DE 19947, USA.
  • Tilmon K; Ohio Agricultural Research and Development Center, Wooster, OH 44691, USA.
  • Reay-Jones F; Department of Plant and Environmental Sciences, Clemson University, Florence, SC 29501, USA.
  • Porter P; Department of Entomology, AgriLife Research and Extension Center, Texas A&M University, Lubbock, TX 79401, USA.
  • Smith J; Department of Plant Agriculture, University of Guelph, Ridgetown Campus, ON N1G 2W1, Canada.
  • Saguez J; CEROM, 740 Chemin Trudeau, Saint-Mathieu-de-Beloeil, QC J3G 0E2, Canada.
  • Wells J; New Brunswick Department of Agriculture, Sussex, NB E4E 5L8, Canada.
  • Congdon C; Perennia Food and Agriculture, Kentville, NS B4N 1J5, Canada.
  • Byker H; Department of Plant Agriculture, University of Guelph, Winchester, ON N1G 2W1, Canada.
  • Jensen B; Arlington Agricultural Research Station, University of Wisconsin, WI 53706, USA.
  • DiFonzo C; Department of Entomology, Michigan State University, East Lansing, MI 48824, USA.
  • Hutchison WD; Department of Entomology, University of Minnesota, St. Paul, MN 55455, USA.
  • Burkness E; Department of Entomology, University of Minnesota, St. Paul, MN 55455, USA.
  • Wright R; Department of Entomology, University of Nebraska-Lincoln, NE 68588, USA.
  • Crossley M; Department of Entomology and Wildlife Ecology, University of Delaware, Newark, DE 19711, USA.
  • Darby H; Department of Plant and Soil Sciences, University of Vermont, Burlington, VT 05405, USA.
  • Bilbo T; Department of Plant and Environmental Sciences, Clemson University, Charleston, SC 29414, USA.
  • Seiter N; Illinois Extension, University of Illinois, Urbana, IL 61820, USA.
  • Krupke C; Department of Entomology, Purdue University, West Lafayette, IN 47906, USA.
  • Abel C; USDA-ARS Corn Insects and Crop Genetics Research, Iowa State University, Ames, IA 50011, USA.
  • Coates BS; USDA-ARS Corn Insects and Crop Genetics Research, Iowa State University, Ames, IA 50011, USA.
  • McManus B; South Dakota State, Brookings, SD 57006, USA.
  • Fuller B; South Dakota State, Brookings, SD 57006, USA.
  • Bradshaw J; Panhandle Research and Extension Center, Scottsbluff, NE 69361, USA.
  • Peterson JA; West Central Research and Extension Center, University of Nebraska, North Platte, NE 69101, USA.
  • Buntin D; Griffin Campus, University of Georgia, Griffin, GA 30223, USA.
  • Paula-Moraes S; UF/IFAS West Florida Research and Education Center, Jay, FL 32565, USA.
  • Kesheimer K; Department of Entomology & Plant Pathology, Auburn University, Auburn, AL 36849, USA.
  • Crow W; Department of Biochemistry, Molecular Biology, Entomology and Plant Pathology, Delta Research and Extension Center, Mississippi State University, Stoneville, MS 39762, USA.
  • Gore J; Department of Biochemistry, Molecular Biology, Entomology and Plant Pathology, Delta Research and Extension Center, Mississippi State University, Stoneville, MS 39762, USA.
  • Huang F; Department of Entomology, Louisiana State University, Baton Rouge, LA 70803, USA.
  • Ludwick DC; Department of Entomology, Texas A&M AgriLife Extension Service, Corpus Christi, TX 78404, USA.
  • Raudenbush A; Ohio Agricultural Research and Development Center, Wooster, OH 44691, USA.
  • Jimenez S; PEI Department of Agriculture and Land, Charlotte, PE C1A 7N8, Canada.
  • Carrière Y; Department of Entomology, University of Arizona, Tucson, AZ 85721, USA.
  • Elkner T; Southeast Research and Extension Center, Landisville, PA 17538, USA.
  • Hamby K; Department of Entomology, University of Maryland, College Park, MD 20742, USA.
Insects ; 14(7)2023 Jun 25.
Article en En | MEDLINE | ID: mdl-37504584
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Insects Año: 2023 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Suiza
Texto completo
Añadir a Mi BVS
Imprimir
XML
PubMed Links
Buscar en Google

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Insects Año: 2023 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Suiza