Interface passivation for 31.25%-efficient perovskite/silicon tandem solar cells.

Chin, Xin Yu; Turkay, Deniz; Steele, Julian A; Tabean, Saba; Eswara, Santhana; Mensi, Mounir; Fiala, Peter; Wolff, Christian M; Paracchino, Adriana; Artuk, Kerem; Jacobs, Daniel; Guesnay, Quentin; Sahli, Florent; Andreatta, Gaëlle; Boccard, Mathieu; Jeangros, Quentin; Ballif, Christophe

Chin, Xin Yu; Turkay, Deniz; Steele, Julian A; Tabean, Saba; Eswara, Santhana; Mensi, Mounir; Fiala, Peter; Wolff, Christian M; Paracchino, Adriana; Artuk, Kerem; Jacobs, Daniel; Guesnay, Quentin; Sahli, Florent; Andreatta, Gaëlle; Boccard, Mathieu; Jeangros, Quentin; Ballif, Christophe.

Afiliación

Chin XY; Photovoltaics and Thin-Film Electronics Laboratory (PV-Lab), Institute of Microengineering (IMT), Ecole Polytechnique Fédérale de Lausanne (EPFL), Neuchâtel, Switzerland.
Turkay D; Centre Suisse d'Électronique et de Microtechnique (CSEM), Neuchâtel, Switzerland.
Steele JA; Photovoltaics and Thin-Film Electronics Laboratory (PV-Lab), Institute of Microengineering (IMT), Ecole Polytechnique Fédérale de Lausanne (EPFL), Neuchâtel, Switzerland.
Tabean S; cMACS, Department of Microbial and Molecular Systems, KU Leuven, 3001 Leuven, Belgium.
Eswara S; Australian Institute for Bioengineering and Nanotechnology, The University of Queensland, Brisbane, QLD 4072, Australia.
Mensi M; School of Mathematics and Physics, The University of Queensland, Brisbane, QLD 4072, Australia.
Fiala P; Advanced Instrumentation for Nano-Analytics (AINA), Luxembourg Institute of Science and Technology (LIST), Materials Research and Technology Department, 41, Rue du Brill, L-4422 Belvaux, Luxembourg.
Wolff CM; University of Luxembourg, 2 Avenue de l'Université, L-4365 Esch-sur-Alzette, Luxembourg.
Paracchino A; Advanced Instrumentation for Nano-Analytics (AINA), Luxembourg Institute of Science and Technology (LIST), Materials Research and Technology Department, 41, Rue du Brill, L-4422 Belvaux, Luxembourg.
Artuk K; Institute of Chemical Sciences and Engineering (ISIC), École Polytechnique Fédérale de Lausanne, Sion, Switzerland.
Jacobs D; Photovoltaics and Thin-Film Electronics Laboratory (PV-Lab), Institute of Microengineering (IMT), Ecole Polytechnique Fédérale de Lausanne (EPFL), Neuchâtel, Switzerland.
Guesnay Q; Photovoltaics and Thin-Film Electronics Laboratory (PV-Lab), Institute of Microengineering (IMT), Ecole Polytechnique Fédérale de Lausanne (EPFL), Neuchâtel, Switzerland.
Sahli F; Centre Suisse d'Électronique et de Microtechnique (CSEM), Neuchâtel, Switzerland.
Andreatta G; Photovoltaics and Thin-Film Electronics Laboratory (PV-Lab), Institute of Microengineering (IMT), Ecole Polytechnique Fédérale de Lausanne (EPFL), Neuchâtel, Switzerland.
Boccard M; Photovoltaics and Thin-Film Electronics Laboratory (PV-Lab), Institute of Microengineering (IMT), Ecole Polytechnique Fédérale de Lausanne (EPFL), Neuchâtel, Switzerland.
Jeangros Q; Photovoltaics and Thin-Film Electronics Laboratory (PV-Lab), Institute of Microengineering (IMT), Ecole Polytechnique Fédérale de Lausanne (EPFL), Neuchâtel, Switzerland.
Ballif C; Centre Suisse d'Électronique et de Microtechnique (CSEM), Neuchâtel, Switzerland.

Science ; 381(6653): 59-63, 2023 Jul 07.

Article en En | MEDLINE | ID: mdl-37410835

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Science Año: 2023 Tipo del documento: Article País de afiliación: Suiza Pais de publicación: Estados Unidos

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