Robust Local Thickness Estimation of Sub-Micrometer Specimen by 4D-STEM.

Skoupý, Radim; Boltje, Daan B; Slouf, Miroslav; Mrázová, Katerina; Láznicka, Tomás; Taisne, Clémence M; Krzyzánek, Vladislav; Hoogenboom, Jacob P; Jakobi, Arjen J

Skoupý, Radim; Boltje, Daan B; Slouf, Miroslav; Mrázová, Katerina; Láznicka, Tomás; Taisne, Clémence M; Krzyzánek, Vladislav; Hoogenboom, Jacob P; Jakobi, Arjen J.

Afiliación

Skoupý R; Institute of Scientific Instruments, Czech Academy of Sciences, Brno, 61264, CZ.
Boltje DB; Department of Bionanoscience, Delft University of Technology, Delft, 2628 CD, NL.
Slouf M; Kavli Institute of Nanoscience, Delft University of Technology, Delft, 2628 CJ, NL.
Mrázová K; Department of Imaging Physics, Delft University of Technology, Delft, 2628 CJ, NL.
Láznicka T; Department of Imaging Physics, Delft University of Technology, Delft, 2628 CJ, NL.
Taisne CM; Institute of Macromolecular Chemistry, Czech Academy of Sciences, Prague, 162 00, CZ.
Krzyzánek V; Institute of Scientific Instruments, Czech Academy of Sciences, Brno, 61264, CZ.
Hoogenboom JP; Institute of Scientific Instruments, Czech Academy of Sciences, Brno, 61264, CZ.
Jakobi AJ; Department of Bionanoscience, Delft University of Technology, Delft, 2628 CD, NL.

Small Methods ; 7(9): e2300258, 2023 Sep.

Article en En | MEDLINE | ID: mdl-37248805

Palabras clave

4D-STEM; FIB milling; TEM analysis; cryo-ET

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Small Methods Año: 2023 Tipo del documento: Article País de afiliación: República Checa Pais de publicación: Alemania

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