Identification of the monolayer thickness difference in a mechanically exfoliated thick flake of hexagonal boron nitride and graphite for van der Waals heterostructures.

Hattori, Yoshiaki; Taniguchi, Takashi; Watanabe, Kenji; Kitamura, Masatoshi

Hattori, Yoshiaki; Taniguchi, Takashi; Watanabe, Kenji; Kitamura, Masatoshi.

Afiliación

Hattori Y; Department of Electrical and Electronic Engineering, Kobe University, 1-1, Rokkodai-cho, Nada, Kobe, 657-8501, Japan.
Taniguchi T; International Center for Materials Nanoarchitectonics, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan.
Watanabe K; Research Center for Functional Materials, National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan.
Kitamura M; Department of Electrical and Electronic Engineering, Kobe University, 1-1, Rokkodai-cho, Nada, Kobe, 657-8501, Japan.

Nanotechnology ; 34(29)2023 May 09.

Article en En | MEDLINE | ID: mdl-37084717

Palabras clave

2D materials; differential interference contrast microscopy; graphite; hBN; optical interferometry

Texto completo

Añadir a Mi BVS

Imprimir

XML

PubMed Links

Buscar en Google

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Diagnostic_studies Idioma: En Revista: Nanotechnology Año: 2023 Tipo del documento: Article País de afiliación: Japón Pais de publicación: Reino Unido

Texto completo

Añadir a Mi BVS

Imprimir

XML

PubMed Links

Buscar en Google