Decoding the phonon transport of structural lubrication at silicon/silicon interface.

Dong, Yun; Ding, Yusong; Rui, Zhiyuan; Lian, Fangming; Tao, Yi; Hui, Weibin; Fu, Rong

Dong, Yun; Ding, Yusong; Rui, Zhiyuan; Lian, Fangming; Tao, Yi; Hui, Weibin; Fu, Rong.

Afiliación

Dong Y; School of Mechanical and Electrical Engineering, Lanzhou University of Technology, Lanzhou, 730050, People's Republic of China.
Ding Y; Institute of Nanomaterials Application Technology, Gansu Academy of Sciences, Lanzhou, 730000, People's Republic of China.
Rui Z; School of Mechanical and Electrical Engineering, Lanzhou University of Technology, Lanzhou, 730050, People's Republic of China.
Lian F; School of Mechanical and Electrical Engineering, Lanzhou University of Technology, Lanzhou, 730050, People's Republic of China.
Tao Y; School of Mechanical and Electrical Engineering, Lanzhou University of Technology, Lanzhou, 730050, People's Republic of China.
Hui W; School of Mechanical Engineering, Southeast University, Nanjing, 211189, People's Republic of China.
Fu R; School of Mechanical and Electrical Engineering, Lanzhou University of Technology, Lanzhou, 730050, People's Republic of China.

Nanotechnology ; 34(21)2023 Mar 13.

Article en En | MEDLINE | ID: mdl-36821852

Palabras clave

commensurate and incommensurate states; energy dissipation channel; interfacial thermal resistance; phonon transport; structural lubrication

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Nanotechnology Año: 2023 Tipo del documento: Article Pais de publicación: Reino Unido

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