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Short-Term Memory Characteristics of IGZO-Based Three-Terminal Devices.
Pyo, Juyeong; Bae, Jong-Ho; Kim, Sungjun; Cho, Seongjae.
Afiliación
  • Pyo J; Division of Electronics and Electrical Engineering, Dongguk University, Seoul 04620, Republic of Korea.
  • Bae JH; School of Electrical Engineering, Kookmin University, Seoul 02707, Republic of Korea.
  • Kim S; Division of Electronics and Electrical Engineering, Dongguk University, Seoul 04620, Republic of Korea.
  • Cho S; Department of Electronics Engineering, Gachon University, Seongnam 13120, Republic of Korea.
Materials (Basel) ; 16(3)2023 Feb 01.
Article en En | MEDLINE | ID: mdl-36770256

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Materials (Basel) Año: 2023 Tipo del documento: Article Pais de publicación: Suiza

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Materials (Basel) Año: 2023 Tipo del documento: Article Pais de publicación: Suiza