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Atomic Imaging of Interface Defects in an Insulating Film on Diamond.
Fujii, Mami N; Tanaka, Masaki; Tsuno, Takumi; Hashimoto, Yusuke; Tomita, Hiroto; Takeuchi, Soichiro; Koga, Shunjo; Sun, Zexu; Enriquez, John Isaac; Morikawa, Yoshitada; Mizuno, Jun; Uenuma, Mutsunori; Uraoka, Yukiharu; Matsushita, Tomohiro.
Afiliación
  • Fujii MN; Faculty of Science and Engineering, Kindai University, 3-4-1 Kowakae, Higashi-Osaka, Osaka 5778502, Japan.
  • Tanaka M; Graduate School of Science and Technology, Nara Institute of Science and Technology, 8916-5 Takayama, Ikoma, Nara 6300192, Japan.
  • Tsuno T; Graduate School of Science and Technology, Nara Institute of Science and Technology, 8916-5 Takayama, Ikoma, Nara 6300192, Japan.
  • Hashimoto Y; Graduate School of Science and Technology, Nara Institute of Science and Technology, 8916-5 Takayama, Ikoma, Nara 6300192, Japan.
  • Tomita H; Graduate School of Science and Technology, Nara Institute of Science and Technology, 8916-5 Takayama, Ikoma, Nara 6300192, Japan.
  • Takeuchi S; Graduate School of Science and Technology, Nara Institute of Science and Technology, 8916-5 Takayama, Ikoma, Nara 6300192, Japan.
  • Koga S; Graduate School of Science and Technology, Nara Institute of Science and Technology, 8916-5 Takayama, Ikoma, Nara 6300192, Japan.
  • Sun Z; Graduate School of Science and Technology, Nara Institute of Science and Technology, 8916-5 Takayama, Ikoma, Nara 6300192, Japan.
  • Enriquez JI; Graduate School of Science and Technology, Nara Institute of Science and Technology, 8916-5 Takayama, Ikoma, Nara 6300192, Japan.
  • Morikawa Y; Department of Precision Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 5650871, Japan.
  • Mizuno J; Department of Precision Engineering, Graduate School of Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 5650871, Japan.
  • Uenuma M; Graduate School of Engineering, Research Center for Precision Engineering, Osaka University, 2-1 Yamadaoka, Suita, Osaka 5650871, Japan.
  • Uraoka Y; Research Organization for Nano and Life Innovation, Waseda University, 1-104 Totsuka-cho, Shinjyuku-ku, Tokyo 1698050, Japan.
  • Matsushita T; Academy of Innovative Semiconductor and Sustainable Manufacturing, National Cheng Kung University, Tainan 70101, Taiwan.
Nano Lett ; 23(4): 1189-1194, 2023 Feb 22.
Article en En | MEDLINE | ID: mdl-36763049

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Nano Lett Año: 2023 Tipo del documento: Article País de afiliación: Japón Pais de publicación: Estados Unidos

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Nano Lett Año: 2023 Tipo del documento: Article País de afiliación: Japón Pais de publicación: Estados Unidos