Your browser doesn't support javascript.
loading
Data-driven stochastic simulation leading to the allometric scaling laws in complex systems.
Kobayashi, Yuh; Takayasu, Hideki; Havlin, Shlomo; Takayasu, Misako.
Afiliación
  • Kobayashi Y; Institute of Innovative Research, Tokyo Institute of Technology, Yokohama 226-8502, Japan.
  • Takayasu H; Sony Computer Science Laboratories, Tokyo 141-0022, Japan.
  • Havlin S; Department of Physics, Bar-Ilan University, Ramat-Gan 52900, Israel.
  • Takayasu M; Institute of Innovative Research, Tokyo Institute of Technology, Yokohama 226-8502, Japan.
Phys Rev E ; 106(6-1): 064304, 2022 Dec.
Article en En | MEDLINE | ID: mdl-36671187
We propose a data-driven stochastic method that allows the simulation of a complex system's long-term evolution. Given a large amount of historical data on trajectories in a multi-dimensional phase space, our method simulates the time evolution of a system based on a random selection of partial trajectories in the data without detailed knowledge of the system dynamics. We apply this method to a large data set of time evolution of approximately one million business firms for a quarter century. Accordingly, from simulations starting from arbitrary initial conditions, we obtain a stationary distribution in three-dimensional log-size phase space, which satisfies the allometric scaling laws of three variables. Furthermore, universal distributions of fluctuation around the scaling relations are consistent with the empirical data.
Asunto(s)

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Asunto principal: Simulación por Computador Tipo de estudio: Prognostic_studies Idioma: En Revista: Phys Rev E Año: 2022 Tipo del documento: Article País de afiliación: Japón Pais de publicación: Estados Unidos

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Asunto principal: Simulación por Computador Tipo de estudio: Prognostic_studies Idioma: En Revista: Phys Rev E Año: 2022 Tipo del documento: Article País de afiliación: Japón Pais de publicación: Estados Unidos