3D scattering microphantom sample to assess quantitative accuracy in tomographic phase microscopy techniques.

Krauze, Wojciech; Kus, Arkadiusz; Ziemczonok, Michal; Haimowitz, Max; Chowdhury, Shwetadwip; Kujawinska, Malgorzata

Krauze, Wojciech; Kus, Arkadiusz; Ziemczonok, Michal; Haimowitz, Max; Chowdhury, Shwetadwip; Kujawinska, Malgorzata.

Afiliación

Krauze W; Institute of Micromechanics and Photonics, Warsaw University of Technology, Boboli 8 street, Warsaw, 02-525, Poland. wojciech.krauze@pw.edu.pl.
Kus A; Institute of Micromechanics and Photonics, Warsaw University of Technology, Boboli 8 street, Warsaw, 02-525, Poland.
Ziemczonok M; Institute of Micromechanics and Photonics, Warsaw University of Technology, Boboli 8 street, Warsaw, 02-525, Poland.
Haimowitz M; Department of Electrical Engineering, University of Texas at Austin, 2501 Speedway, Austin, TX, 78712, USA.
Chowdhury S; Department of Electrical Engineering, University of Texas at Austin, 2501 Speedway, Austin, TX, 78712, USA.
Kujawinska M; Institute of Micromechanics and Photonics, Warsaw University of Technology, Boboli 8 street, Warsaw, 02-525, Poland.

Sci Rep ; 12(1): 19586, 2022 11 15.

Article en En | MEDLINE | ID: mdl-36380058

Asunto(s)

Microscopía; Refractometría; Refractometría/métodos; Fantasmas de Imagen; Fotones; Imagenología Tridimensional

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Asunto principal: Refractometría / Microscopía Idioma: En Revista: Sci Rep Año: 2022 Tipo del documento: Article País de afiliación: Polonia Pais de publicación: Reino Unido

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