The Crystalline Structure of Thin Bismuth Layers Grown on Silicon (111) Substrates.

Stanionyte, Sandra; Malinauskas, Tadas; Niaura, Gediminas; Skapas, Martynas; Devenson, Jan; Krotkus, Arunas

Stanionyte, Sandra; Malinauskas, Tadas; Niaura, Gediminas; Skapas, Martynas; Devenson, Jan; Krotkus, Arunas.

Afiliación

Stanionyte S; Center for Physical Sciences and Technology, Sauletekio av. 3, LT-10257 Vilnius, Lithuania.
Malinauskas T; Institute of Photonics and Nanotechnology, Vilnius University, Sauletekio av. 3, LT-10257 Vilnius, Lithuania.
Niaura G; Center for Physical Sciences and Technology, Sauletekio av. 3, LT-10257 Vilnius, Lithuania.
Skapas M; Center for Physical Sciences and Technology, Sauletekio av. 3, LT-10257 Vilnius, Lithuania.
Devenson J; Center for Physical Sciences and Technology, Sauletekio av. 3, LT-10257 Vilnius, Lithuania.
Krotkus A; Center for Physical Sciences and Technology, Sauletekio av. 3, LT-10257 Vilnius, Lithuania.

Materials (Basel) ; 15(14)2022 Jul 12.

Article en En | MEDLINE | ID: mdl-35888313

Palabras clave

bismuth thin film; high-resolution X-ray diffraction; molecular beam epitaxy

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Materials (Basel) Año: 2022 Tipo del documento: Article País de afiliación: Lituania Pais de publicación: Suiza

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