Highly heterogeneous epitaxy of flexoelectric BaTiO<sub>3-Î´</sub> membrane on Ge.

Dai, Liyan; Zhao, Jinyan; Li, Jingrui; Chen, Bohan; Zhai, Shijie; Xue, Zhongying; Di, Zengfeng; Feng, Boyuan; Sun, Yanxiao; Luo, Yunyun; Ma, Ming; Zhang, Jie; Ding, Sunan; Zhao, Libo; Jiang, Zhuangde; Luo, Wenbo; Quan, Yi; Schwarzkopf, Jutta; Schroeder, Thomas; Ye, Zuo-Guang; Xie, Ya-Hong; Ren, Wei; Niu, Gang

Highly heterogeneous epitaxy of flexoelectric BaTiO_3-Î´ membrane on Ge.

Dai, Liyan; Zhao, Jinyan; Li, Jingrui; Chen, Bohan; Zhai, Shijie; Xue, Zhongying; Di, Zengfeng; Feng, Boyuan; Sun, Yanxiao; Luo, Yunyun; Ma, Ming; Zhang, Jie; Ding, Sunan; Zhao, Libo; Jiang, Zhuangde; Luo, Wenbo; Quan, Yi; Schwarzkopf, Jutta; Schroeder, Thomas; Ye, Zuo-Guang; Xie, Ya-Hong; Ren, Wei; Niu, Gang.

Afiliación

Dai L; Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic Science and Engineering & The International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technology, Xi'an Jiaotong Univ
Zhao J; Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic Science and Engineering & The International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technology, Xi'an Jiaotong Univ
Li J; Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic Science and Engineering & The International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technology, Xi'an Jiaotong Univ
Chen B; Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic Science and Engineering & The International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technology, Xi'an Jiaotong Univ
Zhai S; Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic Science and Engineering & The International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technology, Xi'an Jiaotong Univ
Xue Z; State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Science, Shanghai, 200050, China.
Di Z; State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Science, Shanghai, 200050, China.
Feng B; Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, Suzhou, 215123, China.
Sun Y; Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic Science and Engineering & The International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technology, Xi'an Jiaotong Univ
Luo Y; The State Key Laboratory for Manufacturing Systems Engineering & The International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technology, Xi'an Jiaotong University, Xi'an, 710049, China.
Ma M; Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic Science and Engineering & The International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technology, Xi'an Jiaotong Univ
Zhang J; Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic Science and Engineering & The International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technology, Xi'an Jiaotong Univ
Ding S; Suzhou Institute of Nano-Tech and Nano-Bionics, Chinese Academy of Sciences, Suzhou, 215123, China.
Zhao L; The State Key Laboratory for Manufacturing Systems Engineering & The International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technology, Xi'an Jiaotong University, Xi'an, 710049, China.
Jiang Z; The State Key Laboratory for Manufacturing Systems Engineering & The International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technology, Xi'an Jiaotong University, Xi'an, 710049, China.
Luo W; State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu, 611731, China.
Quan Y; Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic Science and Engineering & The International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technology, Xi'an Jiaotong Univ
Schwarzkopf J; School of Microelectronics, Xidian University, Xi'an, 710071, China.
Schroeder T; Leibniz-Institut für Kristallzüchtung, Max-Born-Straße 2, Berlin, 12489, Germany.
Ye ZG; Leibniz-Institut für Kristallzüchtung, Max-Born-Straße 2, Berlin, 12489, Germany.
Xie YH; Department of Chemistry and 4D LABS, Simon Fraser University, Burnaby, BC, V5A 1S6, Canada.
Ren W; Department of Materials Science and Engineering, University of California, Los Angeles, CA, 90095, USA.
Niu G; Electronic Materials Research Laboratory, Key Laboratory of the Ministry of Education & International Center for Dielectric Research, School of Electronic Science and Engineering & The International Joint Laboratory for Micro/Nano Manufacturing and Measurement Technology, Xi'an Jiaotong Univ

Nat Commun ; 13(1): 2990, 2022 May 30.

Article en En | MEDLINE | ID: mdl-35637222

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Nat Commun Asunto de la revista: BIOLOGIA / CIENCIA Año: 2022 Tipo del documento: Article Pais de publicación: Reino Unido

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