Robust importance sampling for error estimation in the context of optimal Bayesian transfer learning.

Maddouri, Omar; Qian, Xiaoning; Alexander, Francis J; Dougherty, Edward R; Yoon, Byung-Jun

Maddouri, Omar; Qian, Xiaoning; Alexander, Francis J; Dougherty, Edward R; Yoon, Byung-Jun.

Afiliación

Maddouri O; Department of Electrical and Computer Engineering, Texas A&M University, College Station, TX 77843, USA.
Qian X; Department of Electrical and Computer Engineering, Texas A&M University, College Station, TX 77843, USA.
Alexander FJ; Computational Science Initiative, Brookhaven National Laboratory, Upton, NY 11973, USA.
Dougherty ER; Computational Science Initiative, Brookhaven National Laboratory, Upton, NY 11973, USA.
Yoon BJ; Department of Electrical and Computer Engineering, Texas A&M University, College Station, TX 77843, USA.

Patterns (N Y) ; 3(3): 100428, 2022 Mar 11.

Article en En | MEDLINE | ID: mdl-35510184

Palabras clave

Bayesian error estimator; OBTL; classification; error estimation; importance sampling; model uncertainty; optimal Bayesian transfer learning; transfer learning

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Prognostic_studies Idioma: En Revista: Patterns (N Y) Año: 2022 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Estados Unidos

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