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Defects Induced Charge Trapping/Detrapping and Hysteresis Phenomenon in MoS2 Field-Effect Transistors: Mechanism Revealed by Anharmonic Marcus Charge Transfer Theory.
Ma, Xiaolei; Liu, Yue-Yang; Zeng, Lang; Chen, Jiezhi; Wang, Runsheng; Wang, Lin-Wang; Wu, Yanqing; Jiang, Xiangwei.
Afiliación
  • Ma X; Institute of Microelectronics, Peking University, Beijing 100871, China.
  • Liu YY; State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China.
  • Zeng L; State Key Laboratory of Superlattices and Microstructures, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China.
  • Chen J; Fert Beijing Institute, MIIT Key Laboratory of Spintronics, School of Integrated Circuit Science and Engineering, Beihang University, Beijing 100191, China.
  • Wang R; School of Information Science and Engineering, Shandong University, Qingdao 266237, China.
  • Wang LW; Institute of Microelectronics, Peking University, Beijing 100871, China.
  • Wu Y; Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, California 94720, United States.
  • Jiang X; Institute of Microelectronics, Peking University, Beijing 100871, China.
ACS Appl Mater Interfaces ; 14(1): 2185-2193, 2022 Jan 12.
Article en En | MEDLINE | ID: mdl-34931795
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: ACS Appl Mater Interfaces Asunto de la revista: BIOTECNOLOGIA / ENGENHARIA BIOMEDICA Año: 2022 Tipo del documento: Article País de afiliación: China Pais de publicación: Estados Unidos
Texto completo
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: ACS Appl Mater Interfaces Asunto de la revista: BIOTECNOLOGIA / ENGENHARIA BIOMEDICA Año: 2022 Tipo del documento: Article País de afiliación: China Pais de publicación: Estados Unidos