Bloch Surface Waves Mediated Micro-Spectroscopy.

Wang, Ruxue; Lei, Xinrui; Liu, Li; Wu, Longsheng; Wu, Aimin

Wang, Ruxue; Lei, Xinrui; Liu, Li; Wu, Longsheng; Wu, Aimin.

Afiliación

Wang R; State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, CAS, Shanghai, 200050, P. R. China.
Lei X; Center of Materials Science and Opto-Electronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, P. R. China.
Liu L; Nanophotonics Research Center, Shenzhen Key Laboratory of Micro-Scale Optical Information Technology & Institute of Microscale Optoelectronics, Shenzhen University, Shenzhen, Guangdong, 518060, P. R. China.
Wu L; State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, CAS, Shanghai, 200050, P. R. China.
Wu A; Center of Materials Science and Opto-Electronics Engineering, University of Chinese Academy of Sciences, Beijing, 100049, P. R. China.

Small ; 17(49): e2103688, 2021 12.

Article en En | MEDLINE | ID: mdl-34655155

Asunto(s)

Refractometría; Silicio; Algoritmos; Luz; Análisis Espectral

Palabras clave

bloch surface waves; dispersion relations; micro-spectrometers; nanoparticles

Texto completo

Añadir a Mi BVS

Imprimir

XML

PubMed Links

Buscar en Google

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Asunto principal: Refractometría / Silicio Idioma: En Revista: Small Asunto de la revista: ENGENHARIA BIOMEDICA Año: 2021 Tipo del documento: Article Pais de publicación: Alemania

Texto completo

Añadir a Mi BVS

Imprimir

XML

PubMed Links

Buscar en Google