4.2 K sensitivity-tunable radio frequency reflectometry of a physically defined p-channel silicon quantum dot.

Bugu, Sinan; Nishiyama, Shimpei; Kato, Kimihiko; Liu, Yongxun; Murakami, Shigenori; Mori, Takahiro; Ferrus, Thierry; Kodera, Tetsuo

4.2 K sensitivity-tunable radio frequency reflectometry of a physically defined p-channel silicon quantum dot.

Bugu, Sinan; Nishiyama, Shimpei; Kato, Kimihiko; Liu, Yongxun; Murakami, Shigenori; Mori, Takahiro; Ferrus, Thierry; Kodera, Tetsuo.

Afiliación

Bugu S; Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro-ku, Tokyo, 152-8552, Japan. sinanbugu@gmail.com.
Nishiyama S; Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro-ku, Tokyo, 152-8552, Japan.
Kato K; Device Technology Research Institute (D-Tech), National Institute of Advanced Industrial Science and Technology (AIST), Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki, 305-8568, Japan.
Liu Y; Device Technology Research Institute (D-Tech), National Institute of Advanced Industrial Science and Technology (AIST), Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki, 305-8568, Japan.
Murakami S; Device Technology Research Institute (D-Tech), National Institute of Advanced Industrial Science and Technology (AIST), Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki, 305-8568, Japan.
Mori T; Device Technology Research Institute (D-Tech), National Institute of Advanced Industrial Science and Technology (AIST), Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki, 305-8568, Japan.
Ferrus T; Hitachi Cambridge Laboratory, J. J. Thomson Avenue, CB3 0HE, Cambridge, UK.
Kodera T; Tokyo Institute of Technology, 2-12-1 Ookayama, Meguro-ku, Tokyo, 152-8552, Japan. kodera.t.ac@m.titech.ac.jp.

Sci Rep ; 11(1): 20039, 2021 Oct 08.

Article en En | MEDLINE | ID: mdl-34625617

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Diagnostic_studies Idioma: En Revista: Sci Rep Año: 2021 Tipo del documento: Article País de afiliación: Japón Pais de publicación: Reino Unido

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