Microstructure Evaluation and Impurities in La Containing Silicon Oxynitrides.

Hakeem, Abbas Saeed; Ali, Sharafat; Höche, Thomas; Drmosh, Qasem Ahmed; Khan, Amir Azam; Jonson, Bo

Hakeem, Abbas Saeed; Ali, Sharafat; Höche, Thomas; Drmosh, Qasem Ahmed; Khan, Amir Azam; Jonson, Bo.

Afiliación

Hakeem AS; Interdisciplinary Research Center for Hydrogen & Energy Storage (IRC-HES) Research Institute, King Fahd University of Petroleum & Minerals, Dhahran 31261, Saudi Arabia.
Ali S; Department of Built Environment and Energy Technology, Linnæus University, SE-351 95 Växjö, Sweden.
Höche T; Leibniz Institute of Surface Engineering IOM, Permoserstr. 15, D-04318 Leipzig, Germany.
Drmosh QA; Fraunhofer Institute for Microstructure of Materials and Systems IMWS, Walter-Huelse-Strasse 1, D-06120 Halle, Germany.
Khan AA; Interdisciplinary Research Center for Hydrogen & Energy Storage (IRC-HES) Research Institute, King Fahd University of Petroleum & Minerals, Dhahran 31261, Saudi Arabia.
Jonson B; School of Chemical and Materials Engineering, National University of Science & Technology, Islamabad H-12, Pakistan.

Nanomaterials (Basel) ; 11(8)2021 Jul 23.

Article en En | MEDLINE | ID: mdl-34443723

Palabras clave

characterisation; defects; electron microscopy; nitrogen enrich; oxynitride glass; transparency

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Nanomaterials (Basel) Año: 2021 Tipo del documento: Article País de afiliación: Arabia Saudita Pais de publicación: Suiza

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