Validity of point-mass model in off-resonance dynamic atomic force microscopy.

Rajput, Shatruhan Singh; Deopa, Surya Pratap S; Ajith, V J; Kamerkar, Sukrut C; Patil, Shivprasad

Rajput, Shatruhan Singh; Deopa, Surya Pratap S; Ajith, V J; Kamerkar, Sukrut C; Patil, Shivprasad.

Afiliación

Rajput SS; Department of Physics, Indian Institute of Science Education and Research Pune, Dr Homi Bhabha Road, Pashan, Pune 411008, India.
Deopa SPS; Department of Physics, Indian Institute of Science Education and Research Pune, Dr Homi Bhabha Road, Pashan, Pune 411008, India.
Ajith VJ; Department of Physics, Indian Institute of Science Education and Research Pune, Dr Homi Bhabha Road, Pashan, Pune 411008, India.
Kamerkar SC; Department of Biology, Indian Institute of Science Education and Research Pune, Dr Homi Bhabha Road, Pashan, Pune 411008, India.
Patil S; Department of Physics, Indian Institute of Science Education and Research Pune, Dr Homi Bhabha Road, Pashan, Pune 411008, India.

Nanotechnology ; 32(40)2021 Jul 12.

Article en En | MEDLINE | ID: mdl-34144547

Palabras clave

amplitude-modulation AFM; atomic force microscope (AFM); single-molecule force spectroscopy; viscoelasticity

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Prognostic_studies Idioma: En Revista: Nanotechnology Año: 2021 Tipo del documento: Article País de afiliación: India Pais de publicación: Reino Unido

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