Improvement of Detection Limits for Particle Contamination by Confocal Configuration in X-Ray Fluorescence Microscope.

Nakano, Hitomi; Komatani, Shintaro; Matsuyama, Tsugufumi; Tsuji, Kouichi

Nakano, Hitomi; Komatani, Shintaro; Matsuyama, Tsugufumi; Tsuji, Kouichi.

Afiliación

Nakano H; Analytical Technology Department, HORIBA TECHNO SERVICE Co., Ltd., 2 Kisshoin-Miyanohigashi-cho Minami, Kyoto, 601-8305, Japan. hitomi.nakano@horiba.com.
Komatani S; Department of Applied Chemistry & Bioengineering, Graduate School of Engineering, Osaka City University, 3-3-138 Sugimoto-cho Sumiyoshi, Osaka, 558-8585, Japan. hitomi.nakano@horiba.com.
Matsuyama T; Analytical Technology Department, HORIBA TECHNO SERVICE Co., Ltd., 2 Kisshoin-Miyanohigashi-cho Minami, Kyoto, 601-8305, Japan.
Tsuji K; Department of Applied Chemistry & Bioengineering, Graduate School of Engineering, Osaka City University, 3-3-138 Sugimoto-cho Sumiyoshi, Osaka, 558-8585, Japan.

Anal Sci ; 37(10): 1447-1451, 2021 Oct 10.

Article en En | MEDLINE | ID: mdl-34024866

Palabras clave

Confocal micro-XRF; fine particle contamination; high-sensitivity analysis; micro-XRF

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Diagnostic_studies Idioma: En Revista: Anal Sci Año: 2021 Tipo del documento: Article País de afiliación: Japón Pais de publicación: Suiza

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