Optimizing the SEM specimen preparation method for accurate microanalysis of carbon nanotube/nanocluster hybrids.

Yue, Nailin; Wang, Li; He, Xingquan; Liu, Hongyan; Zhang, Wei

Yue, Nailin; Wang, Li; He, Xingquan; Liu, Hongyan; Zhang, Wei.

Afiliación

Yue N; State Key Laboratory of Automotive Simulation and Control, and School of Materials Science & Engineering, and Electron Microscopy Center, and International Center of Future Science, Jilin University, Changchun, China.
Wang L; School of Chemistry and Environmental Engineering, Changchun University of Science and Technology, Changchun, China.
He X; School of Chemistry and Environmental Engineering, Changchun University of Science and Technology, Changchun, China.
Liu H; State Key Laboratory of Automotive Simulation and Control, and School of Materials Science & Engineering, and Electron Microscopy Center, and International Center of Future Science, Jilin University, Changchun, China.
Zhang W; State Key Laboratory of Automotive Simulation and Control, and School of Materials Science & Engineering, and Electron Microscopy Center, and International Center of Future Science, Jilin University, Changchun, China.

J Microsc ; 282(3): 267-273, 2021 Jun.

Article en En | MEDLINE | ID: mdl-33797758

Palabras clave

EDS; EDS elemental mapping; SEM; backscattered electron image; carbon nanotubes; preparation method; secondary electron image

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: J Microsc Año: 2021 Tipo del documento: Article País de afiliación: China Pais de publicación: Reino Unido

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