High Current Density in Monolayer MoS2 Doped by AlOx.
ACS Nano
; 15(1): 1587-1596, 2021 Jan 26.
Article
en En
| MEDLINE
| ID: mdl-33405894
Semiconductors require stable doping for applications in transistors, optoelectronics, and thermoelectrics. However, this has been challenging for two-dimensional (2D) materials, where existing approaches are either incompatible with conventional semiconductor processing or introduce time-dependent, hysteretic behavior. Here we show that low-temperature (<200⯰C) substoichiometric AlOx provides a stable n-doping layer for monolayer MoS2, compatible with circuit integration. This approach achieves carrier densities >2 × 1013 cm-2, sheet resistance as low as â¼7 kΩ/â¡, and good contact resistance â¼480 Ω·µm in transistors from monolayer MoS2 grown by chemical vapor deposition. We also reach record current density of nearly 700 µA/µm (>110 MA/cm2) along this three-atom-thick semiconductor while preserving transistor on/off current ratio >106. The maximum current is ultimately limited by self-heating (SH) and could exceed 1 mA/µm with better device heat sinking. With their 0.1 nA/µm off-current, such doped MoS2 devices approach several low-power transistor metrics required by the international technology roadmap.
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1
Colección:
01-internacional
Base de datos:
MEDLINE
Idioma:
En
Revista:
ACS Nano
Año:
2021
Tipo del documento:
Article
País de afiliación:
Estados Unidos
Pais de publicación:
Estados Unidos