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A Multiscale Topographical Analysis Based on Morphological Information: The HEVC Multiscale Decomposition.
Eseholi, Tarek; Coudoux, François-Xavier; Corlay, Patrick; Sadli, Rahmad; Bigerelle, Maxence.
Afiliación
  • Eseholi T; Opto-Acousto-Electronics Department, Institute of Electronics, Microelectronics and Nanotechnology (IEMN), UMR-CNRS 8520, Polytechnic University of Hauts-de-France, Le Mont Houy, 59313 Valenciennes, France.
  • Coudoux FX; Opto-Acousto-Electronics Department, Institute of Electronics, Microelectronics and Nanotechnology (IEMN), UMR-CNRS 8520, Polytechnic University of Hauts-de-France, Le Mont Houy, 59313 Valenciennes, France.
  • Corlay P; Opto-Acousto-Electronics Department, Institute of Electronics, Microelectronics and Nanotechnology (IEMN), UMR-CNRS 8520, Polytechnic University of Hauts-de-France, Le Mont Houy, 59313 Valenciennes, France.
  • Sadli R; Opto-Acousto-Electronics Department, Institute of Electronics, Microelectronics and Nanotechnology (IEMN), UMR-CNRS 8520, Polytechnic University of Hauts-de-France, Le Mont Houy, 59313 Valenciennes, France.
  • Bigerelle M; Laboratory of Industrial and Human Automation Control, Mechanical Engineering and Computer Science, (LAMIH) UMR-CNRS 8201, Polytechnic University of Hauts-de-France, Le Mont Houy, 59313 Valenciennes, France.
Materials (Basel) ; 13(23)2020 Dec 07.
Article en En | MEDLINE | ID: mdl-33297533
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Materials (Basel) Año: 2020 Tipo del documento: Article País de afiliación: Francia Pais de publicación: Suiza
Texto completo
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Materials (Basel) Año: 2020 Tipo del documento: Article País de afiliación: Francia Pais de publicación: Suiza