Electron backscattered diffraction using a new monolithic direct detector: High resolution and fast acquisition.

Wang, Fulin; Echlin, McLean P; Taylor, Aidan A; Shin, Jungho; Bammes, Benjamin; Levin, Barnaby D A; De Graef, Marc; Pollock, Tresa M; Gianola, Daniel S

Wang, Fulin; Echlin, McLean P; Taylor, Aidan A; Shin, Jungho; Bammes, Benjamin; Levin, Barnaby D A; De Graef, Marc; Pollock, Tresa M; Gianola, Daniel S.

Afiliación

Wang F; Materials Department, University of California Santa Barbara, Santa Barbara, CA 93117, USA.
Echlin MP; Materials Department, University of California Santa Barbara, Santa Barbara, CA 93117, USA.
Taylor AA; Materials Department, University of California Santa Barbara, Santa Barbara, CA 93117, USA.
Shin J; Materials Department, University of California Santa Barbara, Santa Barbara, CA 93117, USA.
Bammes B; Direct Electron LP, San Diego, CA 92128, USA.
Levin BDA; Direct Electron LP, San Diego, CA 92128, USA.
De Graef M; Department of Materials Science and Engineering, Carnegie Mellon University, Pittsburgh, PA 15213, USA.
Pollock TM; Materials Department, University of California Santa Barbara, Santa Barbara, CA 93117, USA.
Gianola DS; Materials Department, University of California Santa Barbara, Santa Barbara, CA 93117, USA. Electronic address: gianola@ucsb.edu.

Ultramicroscopy ; 220: 113160, 2021 Jan.

Article en En | MEDLINE | ID: mdl-33197699

Palabras clave

Direct detection; EBSD; Indexing; Inpainting; SEM; Sparse sampling

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Ultramicroscopy Año: 2021 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Países Bajos

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