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High-Efficiency Silicon Inverted Pyramid-Based Passivated Emitter and Rear Cells.
Gao, Kun; Liu, Ying; Fan, Yuan; Shi, Linxing; Zhuang, Yufeng; Cui, Yanfeng; Yuan, Shengzhao; Wan, Yimao; Shen, Wenzhong; Huang, Zengguang.
Afiliación
  • Gao K; School of Science, and School of Chemical Engineering, Jiangsu Ocean University, Lianyungang, 222005, Jiangsu Province, People's Republic of China.
  • Liu Y; School of Science, and School of Chemical Engineering, Jiangsu Ocean University, Lianyungang, 222005, Jiangsu Province, People's Republic of China.
  • Fan Y; School of Science, and School of Chemical Engineering, Jiangsu Ocean University, Lianyungang, 222005, Jiangsu Province, People's Republic of China.
  • Shi L; School of Science, and School of Chemical Engineering, Jiangsu Ocean University, Lianyungang, 222005, Jiangsu Province, People's Republic of China.
  • Zhuang Y; Risen Solar Technology Co., Ltd., Changzhou, 213200, Jiangsu Province, People's Republic of China.
  • Cui Y; Risen Solar Technology Co., Ltd., Changzhou, 213200, Jiangsu Province, People's Republic of China.
  • Yuan S; Risen Solar Technology Co., Ltd., Changzhou, 213200, Jiangsu Province, People's Republic of China.
  • Wan Y; Risen Solar Technology Co., Ltd., Changzhou, 213200, Jiangsu Province, People's Republic of China.
  • Shen W; School of Physics and Astronomy, Key Laboratory of Artificial Structures and Quantum Control (Ministry of Education), Shanghai Jiao Tong University, Shanghai, 200240, People's Republic of China.
  • Huang Z; School of Science, and School of Chemical Engineering, Jiangsu Ocean University, Lianyungang, 222005, Jiangsu Province, People's Republic of China. zghuang@jou.edu.cn.
Nanoscale Res Lett ; 15(1): 174, 2020 Aug 28.
Article en En | MEDLINE | ID: mdl-32857219
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Nanoscale Res Lett Año: 2020 Tipo del documento: Article Pais de publicación: Estados Unidos
Texto completo
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Nanoscale Res Lett Año: 2020 Tipo del documento: Article Pais de publicación: Estados Unidos