Electrical and Thermal Transport through Silver Nanowires and Their Contacts: Effects of Elastic Stiffening.

Zhao, Yang; Fitzgerald, Matthew L; Tao, Yi; Pan, Zhiliang; Sauti, Godfrey; Xu, Dongyan; Xu, Ya-Qiong; Li, Deyu

Zhao, Yang; Fitzgerald, Matthew L; Tao, Yi; Pan, Zhiliang; Sauti, Godfrey; Xu, Dongyan; Xu, Ya-Qiong; Li, Deyu.

Afiliación

Zhao Y; Department of Mechanical Engineering, Vanderbilt University, Nashville, Tennessee 37235, United States.
Fitzgerald ML; Department of Mechanical Engineering, Vanderbilt University, Nashville, Tennessee 37235, United States.
Tao Y; Department of Mechanical Engineering, Vanderbilt University, Nashville, Tennessee 37235, United States.
Pan Z; School of Mechanical Engineering and Jiangsu Key Laboratory for Design and Manufacture of Micro-Nano Biomedical Instruments, Southeast University, Nanjing 210096, China.
Sauti G; Department of Mechanical Engineering, Vanderbilt University, Nashville, Tennessee 37235, United States.
Xu D; NASA Langley Research Center, Hampton, Virginia 23681-2199, United States.
Xu YQ; Department of Mechanical and Automation Engineering, The Chinese University of Hong Kong, Shatin, New Territories, Hong Kong Special Administrative Region, China.
Li D; Department of Electrical Engineering and Computer Science, Vanderbilt University, Nashville, Tennessee 37235, United States.

Nano Lett ; 20(10): 7389-7396, 2020 Oct 14.

Article en En | MEDLINE | ID: mdl-32833462

Palabras clave

Lorenz number; contact resistance; elastic stiffening; electron−phonon interaction; silver nanowire

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Nano Lett Año: 2020 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Estados Unidos

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