X-ray optics and beam characterization using random modulation: experiments.

Berujon, Sebastien; Cojocaru, Ruxandra; Piault, Pierre; Celestre, Rafael; Roth, Thomas; Barrett, Raymond; Ziegler, Eric

Berujon, Sebastien; Cojocaru, Ruxandra; Piault, Pierre; Celestre, Rafael; Roth, Thomas; Barrett, Raymond; Ziegler, Eric.

Afiliación

Berujon S; European Synchrotron Radiation Facility, CS 40220, F-38043 Grenoble Cedex 9, France.
Cojocaru R; European Synchrotron Radiation Facility, CS 40220, F-38043 Grenoble Cedex 9, France.
Piault P; European Synchrotron Radiation Facility, CS 40220, F-38043 Grenoble Cedex 9, France.
Celestre R; European Synchrotron Radiation Facility, CS 40220, F-38043 Grenoble Cedex 9, France.
Roth T; European Synchrotron Radiation Facility, CS 40220, F-38043 Grenoble Cedex 9, France.
Barrett R; European Synchrotron Radiation Facility, CS 40220, F-38043 Grenoble Cedex 9, France.
Ziegler E; European Synchrotron Radiation Facility, CS 40220, F-38043 Grenoble Cedex 9, France.

J Synchrotron Radiat ; 27(Pt 2): 293-304, 2020 Mar 01.

Article en En | MEDLINE | ID: mdl-32153268

Palabras clave

at-wavelength metrology; metrology; near-field speckle-based phase-sensing; optics; speckle

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Tipo de estudio: Clinical_trials Idioma: En Revista: J Synchrotron Radiat Asunto de la revista: RADIOLOGIA Año: 2020 Tipo del documento: Article País de afiliación: Francia Pais de publicación: Estados Unidos

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