Temperature Dependence of Low Frequency Noise in Silicon on Insulator Tunneling Field Effect Transistor.

Song, Hyun-Dong; Song, Hyeong-Sub; Eadi, Sunil Babu; Choi, Hyun-Woong; Lee, Ga-Won; Lee, Hi-Deok

Song, Hyun-Dong; Song, Hyeong-Sub; Eadi, Sunil Babu; Choi, Hyun-Woong; Lee, Ga-Won; Lee, Hi-Deok.

Afiliación

Song HD; Department of Electronics Engineering, Chungnam National University, Daejeon 34134, Korea.
Song HS; Department of Electronics Engineering, Chungnam National University, Daejeon 34134, Korea.
Eadi SB; Department of Electronics Engineering, Chungnam National University, Daejeon 34134, Korea.
Choi HW; Department of Electronics Engineering, Chungnam National University, Daejeon 34134, Korea.
Lee GW; Department of Electronics Engineering, Chungnam National University, Daejeon 34134, Korea.
Lee HD; Department of Electronics Engineering, Chungnam National University, Daejeon 34134, Korea.

J Nanosci Nanotechnol ; 20(8): 4699-4703, 2020 Aug 01.

Article en En | MEDLINE | ID: mdl-32126643

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: J Nanosci Nanotechnol Año: 2020 Tipo del documento: Article Pais de publicación: Estados Unidos

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