A statistical approach to correct X-ray response non-uniformity in microstrip detectors for high-accuracy and high-resolution total-scattering measurements.

Kato, Kenichi; Tanaka, Yoshihito; Yamauchi, Miho; Ohara, Koji; Hatsui, Takaki

Kato, Kenichi; Tanaka, Yoshihito; Yamauchi, Miho; Ohara, Koji; Hatsui, Takaki.

Afiliación

Kato K; RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148, Japan.
Tanaka Y; Graduate School of Material Science, University of Hyogo, 3-2-1 Kouto, Kamigori-cho, Ako-gun, Hyogo 678-1297, Japan.
Yamauchi M; International Institute for Carbon-Neutral Energy Research (WPI-I2CNER), Kyushu University, 744 Moto-oka, Nishi-ku, Fukuoka 819-0395, Japan.
Ohara K; Research and Utilization Division, Japan Synchrotron Radiation Research Institute (JASRI, SPring-8), 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan.
Hatsui T; RIKEN SPring-8 Center, 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5148, Japan.

J Synchrotron Radiat ; 26(Pt 3): 762-773, 2019 May 01.

Article en En | MEDLINE | ID: mdl-31074441

Palabras clave

Poisson noise; flat-field calibration; microstrip detectors; pair distribution functions; total scattering

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: J Synchrotron Radiat Asunto de la revista: RADIOLOGIA Año: 2019 Tipo del documento: Article País de afiliación: Japón Pais de publicación: Estados Unidos

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