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Wavelength-scale ptychographic coherent diffractive imaging using a high-order harmonic source.
Tadesse, Getnet K; Eschen, Wilhelm; Klas, Robert; Tschernajew, Maxim; Tuitje, Frederik; Steinert, Michael; Zilk, Matthias; Schuster, Vittoria; Zürch, Michael; Pertsch, Thomas; Spielmann, Christian; Limpert, Jens; Rothhardt, Jan.
Afiliación
  • Tadesse GK; Helmholtz-Institute Jena, Fröbelstieg 3, 07743, Jena, Germany. getnet.tadesse@uni-jena.de.
  • Eschen W; Institute of Applied Physics, Abbe Center of Photonics, Friedrich-Schiller-University Jena, Albert-Einstein-Straße 15, 07745, Jena, Germany. getnet.tadesse@uni-jena.de.
  • Klas R; Helmholtz-Institute Jena, Fröbelstieg 3, 07743, Jena, Germany.
  • Tschernajew M; Institute of Applied Physics, Abbe Center of Photonics, Friedrich-Schiller-University Jena, Albert-Einstein-Straße 15, 07745, Jena, Germany.
  • Tuitje F; Helmholtz-Institute Jena, Fröbelstieg 3, 07743, Jena, Germany.
  • Steinert M; Institute of Applied Physics, Abbe Center of Photonics, Friedrich-Schiller-University Jena, Albert-Einstein-Straße 15, 07745, Jena, Germany.
  • Zilk M; Helmholtz-Institute Jena, Fröbelstieg 3, 07743, Jena, Germany.
  • Schuster V; Institute of Applied Physics, Abbe Center of Photonics, Friedrich-Schiller-University Jena, Albert-Einstein-Straße 15, 07745, Jena, Germany.
  • Zürch M; Helmholtz-Institute Jena, Fröbelstieg 3, 07743, Jena, Germany.
  • Pertsch T; Institute of Optics and Quantum Electronics, Abbe Center of Photonics, Friedrich-Schiller-University Jena, Max-Wien-Platz 1, 07743, Jena, Germany.
  • Spielmann C; Institute of Applied Physics, Abbe Center of Photonics, Friedrich-Schiller-University Jena, Albert-Einstein-Straße 15, 07745, Jena, Germany.
  • Limpert J; Institute of Applied Physics, Abbe Center of Photonics, Friedrich-Schiller-University Jena, Albert-Einstein-Straße 15, 07745, Jena, Germany.
  • Rothhardt J; Institute of Applied Physics, Abbe Center of Photonics, Friedrich-Schiller-University Jena, Albert-Einstein-Straße 15, 07745, Jena, Germany.
Sci Rep ; 9(1): 1735, 2019 02 11.
Article en En | MEDLINE | ID: mdl-30742029
Ptychography enables coherent diffractive imaging (CDI) of extended samples by raster scanning across the illuminating XUV/X-ray beam, thereby generalizing the unique advantages of CDI techniques. Table-top realizations of this method are urgently needed for many applications in sciences and industry. Previously, it was only possible to image features much larger than the illuminating wavelength with table-top ptychography although knife-edge tests suggested sub-wavelength resolution. However, most real-world imaging applications require resolving of the smallest and closely-spaced features of a sample in an extended field of view. In this work, resolving features as small as 2.5 λ (45 nm) using a table-top ptychography setup is demonstrated by employing a high-order harmonic XUV source with record-high photon flux. For the first time, a Rayleigh-type criterion is used as a direct and unambiguous resolution metric for high-resolution table-top setup. This reliably qualifies this imaging system for real-world applications e.g. in biological sciences, material sciences, imaging integrated circuits and semiconductor mask inspection.

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Sci Rep Año: 2019 Tipo del documento: Article País de afiliación: Alemania Pais de publicación: Reino Unido

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Sci Rep Año: 2019 Tipo del documento: Article País de afiliación: Alemania Pais de publicación: Reino Unido