Your browser doesn't support javascript.
loading
Enhanced Environmental Scanning Electron Microscopy Using Phase Reconstruction and Its Application in Condensation.
Zhang, Lenan; Zhu, Jinlong; Wilke, Kyle L; Xu, Zhenyuan; Zhao, Lin; Lu, Zhengmao; Goddard, Lynford L; Wang, Evelyn N.
Afiliación
  • Zhang L; Department of Mechanical Engineering , Massachusetts Institute of Technology , Cambridge , Massachusetts 02139 , United States.
  • Zhu J; Department of Electrical and Computer Engineering , University of Illinois at Urbana-Champaign , Urbana , Illinois 61801 , United States.
  • Wilke KL; Department of Mechanical Engineering , Massachusetts Institute of Technology , Cambridge , Massachusetts 02139 , United States.
  • Xu Z; Institute of Refrigeration and Cryogenics , Shanghai Jiao Tong University , Shanghai 200240 , China.
  • Zhao L; Department of Mechanical Engineering , Massachusetts Institute of Technology , Cambridge , Massachusetts 02139 , United States.
  • Lu Z; Department of Mechanical Engineering , Massachusetts Institute of Technology , Cambridge , Massachusetts 02139 , United States.
  • Goddard LL; Department of Electrical and Computer Engineering , University of Illinois at Urbana-Champaign , Urbana , Illinois 61801 , United States.
  • Wang EN; Department of Mechanical Engineering , Massachusetts Institute of Technology , Cambridge , Massachusetts 02139 , United States.
ACS Nano ; 13(2): 1953-1960, 2019 02 26.
Article en En | MEDLINE | ID: mdl-30653292

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: ACS Nano Año: 2019 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Estados Unidos

Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: ACS Nano Año: 2019 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Estados Unidos