A simple atomic force microscope-based method for quantifying wear of sliding probes.

Flater, Erin E; Barnes, Jared D; Hitz Graff, Jesse A; Weaver, Jayse M; Ansari, Naveed; Poda, Aimee R; Robert Ashurst, W; Khanal, Subarna R; Jacobs, Tevis D B

Flater, Erin E; Barnes, Jared D; Hitz Graff, Jesse A; Weaver, Jayse M; Ansari, Naveed; Poda, Aimee R; Robert Ashurst, W; Khanal, Subarna R; Jacobs, Tevis D B.

Afiliación

Flater EE; Department of Physics, Luther College, Decorah, Iowa 52101, USA.
Barnes JD; Department of Physics, Luther College, Decorah, Iowa 52101, USA.
Hitz Graff JA; Department of Physics, Luther College, Decorah, Iowa 52101, USA.
Weaver JM; Department of Physics, Luther College, Decorah, Iowa 52101, USA.
Ansari N; Department of Chemical Engineering, Auburn University, Auburn, Alabama 36849, USA.
Poda AR; Department of Chemical Engineering, Auburn University, Auburn, Alabama 36849, USA.
Robert Ashurst W; Department of Chemical Engineering, Auburn University, Auburn, Alabama 36849, USA.
Khanal SR; Department of Mechanical Engineering and Materials Science, University of Pittsburgh, Pittsburgh, Pennsylvania 15261, USA.
Jacobs TDB; Department of Mechanical Engineering and Materials Science, University of Pittsburgh, Pittsburgh, Pennsylvania 15261, USA.

Rev Sci Instrum ; 89(11): 113708, 2018 Nov.

Article en En | MEDLINE | ID: mdl-30501349

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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Rev Sci Instrum Año: 2018 Tipo del documento: Article País de afiliación: Estados Unidos Pais de publicación: Estados Unidos

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