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Charging of electron beam irradiated amorphous carbon thin films at liquid nitrogen temperature.
Hettler, Simon; Onoda, Jo; Wolkow, Robert; Pitters, Jason; Malac, Marek.
Afiliación
  • Hettler S; Laboratory for Electron Microscopy, Karlsruhe Institute of Technology, Engesserstrasse 7, Karlsruhe 76131, Germany. Electronic address: simon.hettler@kit.edu.
  • Onoda J; Department of Physics, University of Alberta, 11421 Drive, Edmonton, Saskatchewan T6G 2E1, Canada.
  • Wolkow R; Department of Physics, University of Alberta, 11421 Drive, Edmonton, Saskatchewan T6G 2E1, Canada.
  • Pitters J; Nanotechnology Research Centre, National Research Council, 11421 Drive, Edmonton, Saskatchewan T6G 2M9, Canada.
  • Malac M; Department of Physics, University of Alberta, 11421 Drive, Edmonton, Saskatchewan T6G 2E1, Canada; Nanotechnology Research Centre, National Research Council, 11421 Drive, Edmonton, Saskatchewan T6G 2M9, Canada.
Ultramicroscopy ; 196: 161-166, 2019 01.
Article en En | MEDLINE | ID: mdl-30412841
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Ultramicroscopy Año: 2019 Tipo del documento: Article Pais de publicación: Países Bajos
Texto completo
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Texto completo: 1 Colección: 01-internacional Base de datos: MEDLINE Idioma: En Revista: Ultramicroscopy Año: 2019 Tipo del documento: Article Pais de publicación: Países Bajos